Personal Information

Name: Pengyan Wen                                  

Gender: Female

Date of Birth: 03/08/1988                              

Title: Associate professor

Major: Microelectronics and Solid-State Electronics         

E-mail: pywen@tongji.edu.cn

Address: Caoan Road 4800, 201804, Shanghai, China

Research interests

Optoelectronic devices (GaN-based lasers, Si-based GaAs/InP microcavity lasers, GaAs/InP photodetectors, etc.)

We have open positions for Masters. Good candidates are encouraged to do an internship with Chinese Academy of Sciences; EPFL, PSI, etc.

Professional Experience

l   03/2023 – Present, Associate Professor, Tongji University, China.

l   03/2020 – 02/2023, Experienced Researcher (Marie Curie Research Fellow), IBM Research GmbH, Switzerland.

l   01/2019 – 02/2020, Associate Researcher, Nano Devices and Materials Division, Suzhou Institute of Nano-tech and Nano-bionics (SINANO), Chinese Academy of Science (CAS), China.

l   10/2018 – 12/2018, Assistant Researcher, Nano Devices and Materials Division, SINANO, CAS, China.

l   08/2016 – 09/2018, Postdoc, Nano Devices and Materials Division, SINANO, CAS, China.

Education

l   09/2011 – 07/2016, Ph.D., University of Chinese Academy of Sciences (UCAS). Majoring in Microelectronics and solid-state electronics; thesis title – Study on Reliability of GaN-based Laser Diodes.

Awards：

l   Marie Sklodowska-Curie Fellow (~10%, 2020)

l   Excellent Postdoctoral Fellowship from CPSF-CAS (~1%, 2016)

l   Outstanding PhD Graduate of University of Chinese Academy of Sciences (~5%, 2016)

Approved Research Projects：

l   Defect Analysis and Thermal Effects of Nanolasers and Emitters, H2020 Marie Sklodowska-Curie Action Individual Fellowship (No. 844541), € ~20 3149.44, 2020-2022. (PI)

l   GaN-based Laser Characterization and Reliability, 2018 Key technology research on Three-color laser diode online detection and aging technology, National Key Research and Development Program of China (No. 2018YFB0406905), ￥4,600,000, 2018-2020. (PI)

l   Active Region Degradation and Stress Induced Defect Analysis in GaN-based Laser Didoes, National Natural Science Foundation of China (No. 61704184), ￥250 000, 2017-2019. (PI)

l   Stress-induced Defect Analysis in Active Region of GaN-based laser diodes, Natural Science Foundation of Jiangsu Province (No. BK20170430),￥200 000, 2017-2019. (PI)

l   Degradation of High Power GaN-based Blue Laser Didoes, CPSF-CAS Joint Foundation for Excellent Postdoctoral Fellows(No. 2016LH0026), ￥200000 (€ ~25 000), 2016-2018. (PI)

Publications：

[1]      P. Wen, P. Tiwari, S. Mauthe, H. Schmid, M. Sousa, M. Scherrer, M. Baumann, B. I. Bitachon, J. Leuthold, B. Gotsmann and K. E. Moselund, Waveguide coupled III-V photodiodes monolithically integrated on Si, Nature Communications, 13, 909, 2022.

[2]      P. Wen, P. Tiwari, M. Scherrer, E. Lorster, B. Gotsmann and K. E. Moselund, Thermal simulation and experimental analysis of InP-on-Si micro- and nanocavity lasers, ACS Photonics, 9, 1338-48, 2022.

[3]      Q. Ding, P. Wen, B. Gotsmann, K. E. Moselund and A. Schenk, Self-heating analysis of monolithically integrated hybrid III-V/Si PIN diode, SPIE Photonics Europe, Strasbourg, France,12148, 12148OE, 2022.

[4]      P. Xu, H. Xiu, L. Yin, P. Wen, Y. Xue and J. Yang, The effect of humidity on the degradation mechanisms of GaN-based green laser diodes, Optics & Laser Technology, 157, 108662, 2022.

[5]      P. Wen, P. Tiwari, K. E. Moselund and B. Gotsmann, Thermal and optical simulation of InP on Si nanocavity lasers, 21st International Conference on Numerical simulation of Optoelectronic Devices (NUSOD), 52207, 9541426, 2021.

[6]      P. Wen, P. Tiwari, B. Gotsmann and K. E. Moselund, Modelling of thermal effects in InP-on-Si nanocavity lasers, IEEE 17^th International Conference on Group IV Photonics(GFP), 51802, 9673942, 2021.

[7]      P. Tiwari, P. Wen, D. Caimi, S. Mauthe, N. V. Trivino, M. Sousa and K. E. Moselund, Scaling of Metal-Clad InP Nanodisk Lasers: Optical Performance and Thermal Effects, Optics Express, 29, 3915-27, 2021.

[8]      P. Tiwari, P. Wen, S. Mauthe, M. Baumann, B. I. Bitachon, H. Schmid, J. Leuthold and K. E. Moselund, Butt-Coupled III-V Photodetector Monolithically Integrated on SOI with data reception at 50 Gbps OOK, Optical Fiber Communications Conference and Exhibition (OFC), 9490006, 2021.

[9]      M. Scherrer, P. Tiwari, N. V. Trivino, S. Mauthe, P. Wen, H. Schmid and K. E. Moselund, Monolithic integration of in-plane hybrid III-V/Si photonic devices, MikroSystemTechnik, Congress, 2021.

[10]  H. Xiu, P. Xu, P. Wen, Y. Zhang and J. Yang, Rapid degradation of InGaN/GaN green laser diodes, Superlattices and Microstructures, 142, 106517, 2020.

[11]  Y. Tang, M. Feng, P. Wen, J. Liu, J. Wang, X, Sun, Q. Sun, S. Zhang, X. Sheng, M. Ikeda and H. Yang, Degradation study of InGaN-based laser diodes grown on Si, Journal of Physics D: Applied Physics, 53, 39, 2020.

[12]  H. Lin, D. Li, L, Zhang, P. Wen, S. Zhang, J. Liu and H. Yang, Effect of microstructure of Au80Sn20 solder on the thermal resistance TO56 packaged GaN-based laser diodes, Journal of Semiconductors, 41, 102104, 2020.

[13]  P. Tiwari, S. Mauthe, N. V. Triviño, P. Wen, Y. Baumgartner, M. Scherrer, D. Caimi, S. Reidt and K. E. Moselund, Metal-Clad InP Cavities for Nanolasers on Si, IEEE Photonics Conference (IPC), 47351, 9252274, 2020.

[14]  N. Vico Triviño, S. Mauthe, M. Scherrer, P. Tiwari, P. Wen, M. Sousa, H. Schmid and K. E. Moselund, In-plane monolithic integration of scaled III-V photonic devices, European Conference on Optical Communications (ECOC), 48923, 9333303, 2020.

[15]  P. Tiwari, S. Mauthe, N. V. Trivino, P. Staudinger, M. Scherrer, P. Wen, D. Caimi, M. Sousa, H. Schmid and K. E. Moselund, Q. Ding and A. Schenk, Scaled III-V optoelectronic devices on silicon, International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD), 49422, 9217747, 2020.

[16]  P. Wen, H. Xiu, S. Zhang, J. Liu, L. Zhang, A. Tian, F. Zhang, R. Zhou, D. Li, M. Ikeda, W. Zhou and H. Yang, Strain-related degradation of GaN-based blue laser diodes, IEEE Journal of Selected Topics in Quantum Electronics, 25, 2947602, 2019.

[17]  R. Zhou, M. Ikeda, F. Zhang, J. Liu, S. Zhang, A. Tian, P. Wen, D. Li, L. Zhang and H. Yang. Total-InGaN-thickness dependent Shockley-Read-Hall recombination lifetime in InGaN quantum wells, Japanese Journal of Applied Physics, 127, 013103, 2019.

[18]  F. Zhang, M. Ikeda, R. Zhou, J. Liu, S. Zhang, A. Tian, P. Wen, D. Li, L. Zhang and H. Yang, Polarization relaxation in InGaN/(In)GaN multiple quantum wells, Japanese Journal of Applied Physics, 58, SCCB12, 2019.

[19]  R. Zhou, M. Ikeda, F. Zhang, J. Liu, S. Zhang, A. Tian, P. Wen, D. Li, L. Zhang and H. Yang, Steady-state recombination lifetimes in polar InGaN/GaN quantum wells by time-resolved photoluminescence, Japanese Journal of Applied Physics, 58, SCCB07, 2019.

[20]  M. Ikeda, F. Zhang, R. Zhou, J. Liu, S. Zhang, A. Tian, P. Wen, L. Zhang, D. Li and H. Yang, Thermionic emission of carriers in InGaN/(In)GaN multiple quantum wells, Japanese Journal of Applied Physics, 58, SCCB03, 2019.

[21]  J. Hu, S. Zhang, D. Li, F. Zhang, M. Feng, P. Wen, J. Liu, L. Zhang and H. Yang, Thermal analysis of GaN-based laser diode mini-array, Chinese Physics B, 27, 094208, 2018.

[22]  P. Wen, J. Liu, S. Zhang, L. Zhang, M. Ikeda, D. Li, A. Tian, F. Zhang, Y. Cheng, W. Zhou and H. Yang, Asymmetrical quantum well degradation of InGaN/GaN blue laser diodes characterized by photoluminescence, Applied Physics Letters, 111, 212102, 2017.

[23]  F. Zhang, M. Ikeda, S. Zhang, J. Liu, A. Tian, P. Wen, Y. Cheng and H. Yang, Thermal etching rate of GaN during MOCVD growth interruption in hydrogen and ammonia ambient determined by AlGaN/GaN superlattice structures, Journal of Crystal Growth, 475, 93-9, 2017.

[24]  A. Tian, J. Liu, L. Zhang, L. Jiang, M. Ikeda, S. Zhang, D. Li, P. Wen, Y. Cheng, X. Fan and H. Yang, Significant increase of quantum efficiency of green InGaN quantum well by realizing step-flow growth, Applied Physics Letters, 111, 112102, 2017.

[25]  A. Tian, J. Liu, L. Zhang, Z. Li, M. Ikeda, S. Zhang, D. Li, P. Wen, F. Zhang, Y. Cheng, X. Fan and H. Yang, Green laser diodes with low threshold current density via interface engineering of InGaN/GaN quantum well active region, Optics Express, 25, 415, 2017.

[26]  X. Fan, J. Liu, F. Zhang, M. Ikeda, D. Li, S. Zhang, L. Zhang, A. Tian, P. Wen, G. Ma and H. Yang, Effect of droop phenomenon in InGaN/GaN blue laser diodes on threshold current, Chinese Physics Letters, 34, 109-11, 2017.

[27]  Y. Cheng, J. Liu, L. Zhang, D. Jiang, A. Tian, F. Zhang, M. Feng, P. Wen, W. Zhou, S. Zhang, M. Ikeda, D. Li and H. Yang, Suppression of recombination in waveguide in c-plane InGaN-based green laser diodes, Superlattices and Microstructures, 111, 1121-5, 2017.

[28]  P. Wen, S. Zhang, J. Liu, D. Li, L. Zhang, Q. Sun, A. Tian, K. Zhou, T. Zhou and H. Yang, Investigation of InGaN/GaN laser degradation based on luminescence properties, Journal of Applied Physics, 119, 213107, 2016.

[29]  P. Wen, S. Zhang, J. Liu, D. Li, L. Zhang, K. Zhou, X. Su, A. Tian, F. Zhang and H. Yang, Catastrophic degradation of InGaN/GaN blue laser diodes, IEEE Transactions on Device and Materials Reliability, 16, 638-41, 2016.

[30]  P. Wen, S. Zhang, D. Li, J. Liu, L. Zhang, D. Shi, K. Zhou, A. Tian, S. Feng and H. Yang, Investigation of rapid degradation in GaN-based blue laser diodes, Superlattices and Microstructures, 99, 72-6, 2016.

[31]  Y. Huang, P. Wen, D. Li, J. Liu, S. Zhang, L. Zhang and H. Yang, Investigation of output nonlinearity mechanisms in GaN-based blue laser diodes, 13th China International Forum on Solid State Lighting, 978, 16579860, 2016.

[32]  F. Zhang, M. Ikeda, S. Zhang, J. Liu, A. Tian, P. Wen, Y. Cheng and H. Yang, Reduction of polarization field strength in fully strained c-plane InGaN/(In)GaN multiple quantum wells grown by MOCVD, Nanoscale Research Letters, 11, 519, 2016.

[33]  A. Tian, J. Liu, L. Zhang, M. Ikeda, X. Fan, S. Zhang, D. Li, F. Zhang, P. Wen, Y. Cheng and H. Yang, Optical characterization of InGaN/GaN quantum well active region of green laser diodes, Applied Physics Express, 10, 012701, 2016.

[34]  A. Tian, J. Liu, L. Zhang, M. Ikeda, S. Zhang, D. Li, X. Fan, K. Zhou, P. Wen, F. Zhang and H. Yang, Green laser diodes with low operation voltage obtained by suppressing carbon impurity in AlGaN : Mg cladding layer, Physics Status Solidi C, 13, 245-7, 2016.

[35]  P. Wen, D. Li, S. Zhang, J. Liu, L. Zhang, K. Zhou, M. Feng, A. Tian, F. Zhang, C. Zeng and H. Yang, Identification of degradation mechanisms based on thermal characteristics of InGaN/GaN laser diodes, IEEE Journal of Selected Topics in Quantum Electronics, 21, 165-70, 2015.

[36]  P. Wen, S. Zhang, D. Li, J. Liu, L. Zhang, D. Shi, K. Zhou, A. Tian, S. Feng and H. Yang, Identification of degradation mechanisms of blue InGaN/GaN laser diodes, Journal of Physics D: Applied Physics, 48, 415101, 2015.

[37]  P. Wen, D. Li, S. Zhang, J. Liu, L. Zhang, K. Zhou, M. Feng, Z. Li, A. Tian and H. Yang,  Enhanced temperature characteristic of InGaN/GaN laser diodes with uniform multiple quantum wells, Semiconductor Science and Technology, 30, 125015, 2015.

[38]  P. Wen, D. Li, S. Zhang, J. Liu, L. Zhang, K. Zhou, M. Feng, Z. Li, A. Tian and H. Yang, High accuracy thermal resistance measurement in GaN/InGaN laser diodes, Solid-State Electronics, 106, 50-3, 2015.

[39]  D. Shi, S. Feng, Y. Qiao and P. Wen, The research on temperature distribution of GaN-based blue laser diode, Solid-State Electronics, 109, 25-8, 2015.

[40]  A. Tian, J. Liu, M. Ikeda, S. Zhang, Z. Li, M. Feng, K. Zhou, D. Li, L. Zhang, P. Wen, F. Zhang and H. Yang, Conductivity enhancement in AlGaN: Mg by suppressing the incorporation of carbon impurity, Applied Physics Express, 8, 051001, 2015.

[41]  K. Zhou, M. Ikeda, J. Liu, S. Zhang, Z. Li, M. Feng, A. Tian, P. Wen, D. Li, L. Zhang and H. Yang, Abnormal InGaN growth behavior in indium-desorption regime in metalorganic chemical vapor deposition, Journal of Crystal Growth, 409, 51-5, 2015.